Showing all 12 results

AEI Standard

35,00 

Tungsten source for Zeiss, LEO, AEI, Cambridge Instrument, Novascan, Leica & Nanoquest Electron Microscope

ARL

35,00 

Tungsten source for ISI & ABT Electron Microscopes

Cameca type

35,00 

Tungsten source for Cameca Electron Probe MicroAnalyzer CAMEBAX, SX-50, SX-100 and SX-FIVE

ETEC

35,00 

Tungsten source for ETEC Electron Microscopes

Hitachi S-type

35,00 

Tungsten source for Hitachi TM3030 Plus, TM3030, TM3000, TM1000, S3400N, S3700N, SU1500, SU1510 & SU35000 Electron Microscopes

ISI

35,00 

Tungsten source for ISI & ABT Scanning Electron Microscope

Jeol K-type

35,00 

Tungsten source for Jeol SEM & TEM. Filament can be aligned through its cartridge.

Zeiss

35,00 

Tungsten source for Zeiss Scanning Electron Microscope